Xeuss 3.0

Xeuss 3.0 

The Next Generation
(GI-)SAXS/WAXS/USAXS beamline for the laboratory

  • Maximum flexibility

  • Ultimate performance

  • Plenty of space for sample environment

Applications

Size, structure, shape, orientation…

Characterize the nanostructure of soft-matter and nanomaterials using SAXS/WAXS and USAXS technique in transmission or grazing incidence mode.

– Particle size distribution ranging from few nanometers to more than 350 nm in diameter
– Crystallization rates and lamellar structure of semicrystalline polymers
– Size and shape analysis of surfactants or proteins in solutions
– Organization and orientation of nanomaterials at atomic or nanoscale, in bulk phases or at surfaces
– Phase segregation studies of alloys
– In situ studies of nanostructure transitions

BITRODE PARTIAL USER’S LIST

SOVEMA PARTIAL USER’S LIST

TRIOPTICS PARTIAL USER’S LIST

XENOCS PARTIAL USER’S LIST

KALLSTROM PARTIAL USER’S LIST

OXFORD PARTIAL USER’S LIST

HASKRIS PARTIAL USER’S LIST

VINKAROLA PARTIAL USER’S LIST