Choose from a range of ion sources, including gas cluster, C60, liquid metal, and duoplasmatron sources.
C60 Ion Beams
C60 ion beams provide excellent sputter rates on both hard (inorganic) and soft (polymer, organic) materials alike, while achieving spot sizes below 500 nm. A range of beam energies and spot modes are available to suit a wide variety of applications.
Focused ion beam for analytical applications
The IOG C60-20 is a high performance 20 kV ion beam system for SIMS analysis of samples with a high degree of chemical complexity. The use of high mass primary ions provides a substantial yield enhancement of intact molecules and large fragments during the analysis of most organic materials.
- Economical analytical ion beam
- Focus down to 2 µm
- High current beam up to 2 nA
- Gate valve for quick and easy servicing