ToF SIMS with Unparalleled Sensitivity
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance. Combining innovative design and cutting-edge science with a comprehensive list of features, the J105 redefines what ToF SIMS can do.
- Rapid high-resolution 2D and 3D molecular imaging.
- Consistent mass accuracy and mass resolution across all samples, independent of sample height.
- Unrivalled sensitivity and imaging MS performance with Ionoptika’s patented Water Source
- Range of high-performance ion beams to suit every application.
- High-mass accuracy and tandem MS for accurate peak assignment.
- Full cryo-sample handling capabilities.
|ION BEAM||SPECIES||ENERGY RANGE||MIN. SPOT SIZE||APPLICATIONS|
|GCIB SM||Arn, (CO2)n+, (H2O)n+||20-70 kV||1.5 µm||Organic/biological materials, polymers, depth profiling, multi-layered structures|
|GCIB 40||Arn, (CO2)n+, (H2O)n+||10-40 kV||3 µm||Organic/biological materials, polymers, depth profiling|
|IOG C60-40||C60+, C60++, C60+++||10-40 kV||300 nm||Organic/biological materials, inorganics, metals|
|IOG 25||Au+, Au++, Au2+, Au3+||5-25 kV||150 nm||Semiconductors, metals, inorganic materials|
|FLIG 5||O2, Cs||0.2-5 kV||15 µm||Semiconductors, shallow junction depth profiling|