J105 SIMS

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ToF SIMS with Unparalleled Sensitivity

The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance. Combining innovative design and cutting-edge science with a comprehensive list of features, the J105 redefines what ToF SIMS can do.

Key Features

  • Rapid high-resolution 2D and 3D molecular imaging.
  • Consistent mass accuracy and mass resolution across all samples, independent of sample height.
  • Unrivalled sensitivity and imaging MS performance with Ionoptika‚Äôs patented Water Source
  • Range of high-performance ion beams to suit every application.
  • High-mass accuracy and tandem MS for accurate peak assignment.
  • Full cryo-sample handling capabilities.

Options

ION BEAM SPECIES ENERGY RANGE MIN. SPOT SIZE APPLICATIONS
GCIB SM Arn, (CO2)n+, (H2O)n+ 20-70 kV 1.5 µm Organic/biological materials, polymers, depth profiling, multi-layered structures
GCIB 40 Arn, (CO2)n+, (H2O)n+ 10-40 kV 3 µm Organic/biological materials, polymers, depth profiling
IOG C60-40 C60+, C60++, C60+++ 10-40 kV 300 nm Organic/biological materials, inorganics, metals
IOG 25 Au+, Au++, Au2+, Au3+ 5-25 kV 150 nm Semiconductors, metals, inorganic materials
FLIG 5 O2, Cs 0.2-5 kV 15 µm Semiconductors, shallow junction depth profiling

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