J105 SIMS
Other products
ToF SIMS with Unparalleled Sensitivity
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance. Combining innovative design and cutting-edge science with a comprehensive list of features, the J105 redefines what ToF SIMS can do.
Key Features
- Rapid high-resolution 2D and 3D molecular imaging.
- Consistent mass accuracy and mass resolution across all samples, independent of sample height.
- Unrivalled sensitivity and imaging MS performance with Ionoptika’s patented Water Source
- Range of high-performance ion beams to suit every application.
- High-mass accuracy and tandem MS for accurate peak assignment.
- Full cryo-sample handling capabilities.
Options
| ION BEAM | SPECIES | ENERGY RANGE | MIN. SPOT SIZE | APPLICATIONS |
|---|---|---|---|---|
| GCIB SM | Arn, (CO2)n+, (H2O)n+ | 20-70 kV | 1.5 µm | Organic/biological materials, polymers, depth profiling, multi-layered structures |
| GCIB 40 | Arn, (CO2)n+, (H2O)n+ | 10-40 kV | 3 µm | Organic/biological materials, polymers, depth profiling |
| IOG C60-40 | C60+, C60++, C60+++ | 10-40 kV | 300 nm | Organic/biological materials, inorganics, metals |
| IOG 25 | Au+, Au++, Au2+, Au3+ | 5-25 kV | 150 nm | Semiconductors, metals, inorganic materials |
| FLIG 5 | O2, Cs | 0.2-5 kV | 15 µm | Semiconductors, shallow junction depth profiling |
